Circuit Simulation and DFY

Circuit Design and Process Interface

Semiconductor Process Development

Advanced SPICE Modeling Platform – BSIMProPlus™

Introduction

BSIMProPlus™ is industry's leading SPICE modeling platform for advanced semiconductor devices. As the technology and market leader for SPICE modeling, it has been adopted as the standard modeling tool by over 100 worldwide leading semiconductor companies for over 20 years. BSIMProPlus provides the most powerful SPICE modeling functions with its built-in parallel SPICE engine, and offers full SPICE modeling capabilities from baseband to high frequency for various semiconductor devices, including characterization, auto model extraction and parameter optimization, model validation, etc. BSIMProPlus supports all public domain SPICE models and popular proprietary models, and offers the most accurate and efficient SPICE model extraction, customization and validation solutions for advanced process development and integrated circuit designs.

Key Benefits

Golden modeling tool used by all leading foundries and IDMs
Most complete and powerful SPICE modeling functions accumulated for 20+ years
Most accurate and efficient parameter extraction and optimization engines validated by 100+ customers
Most advanced modeling technologies support all advanced process nodes, different types of devices and models

Applications

Advanced semiconductor process development
PDK/SPICE model library development
SPICE model customization and validation

Specifications

Device types supported:MOSFET, SOI, FinFET, BJT/HBT, TFT, MESFET, Diode, Resistor, Inductor, etc
Models supported:BSIM3, BSIM4, BSIM6, BSIM-CMG, BSIM-IMG, BSIMSOI, UTSOI, HiSIM2, HiSIM_HV, PSP, GP-BJT, RPI TFT, etc
Device characteristics supported:DC, AC, Tran, Noise, RF, Statistical, LDE, Reliability, etc
Support user-defined model and Verilog-A
Hspice/Spectre/Eldo-compatible
Support any device- or circuit-level target modeling
Support model auto extraction and parameter optimization
Support popular instruments from Keysight (Agilent)/Keithley for DC/AC/RF/Reliability characterization
Support Cascade/SUSS probe station for wafer-level semi-auto measurement

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